A pulsed S-parameters measurement setup for the non-linear characterization of FETs and bipolar power transistors

  1. Teyssier, J.P.
  2. Campovecchio, M.
  3. Sommet, C.
  4. Portilla, J.
  5. Quere, R.
Aktak:
1993 23rd European Microwave Conference, EuMA 1993

Argitalpen urtea: 1993

Orrialdeak: 489-493

Mota: Biltzar ekarpena

DOI: 10.1109/EUMA.1993.336603 GOOGLE SCHOLAR

Garapen Iraunkorreko Helburuak

Datuen iturria: Scopus