HIL testing of a compact beam position monitor diagnostic for particle accelerators
- Badillo, I.
- Jugo, J.
- San Vicente, C.
- Portilla, J.
- Feuchtwanger, J.
- Etxebarria, V.
Proceedings:
IET Conference Publications
ISBN: 9781849198585
Year of publication: 2014
Volume: 2014
Issue: 630 CP
Type: Conference paper