Ángel
Alegría Loinaz
Université de Toulouse
Tolosa, FranciaPublikationen in Zusammenarbeit mit Forschern von Université de Toulouse (7)
2011
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Broadband nanodielectric spectroscopy by means of amplitude modulation electrostatic force microscopy (AM-EFM)
Ultramicroscopy, Vol. 111, Núm. 8, pp. 1366-1369
2010
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Dielectric properties of thin insulating layers measured by electrostatic force microscopy
EPJ Applied Physics, Vol. 50, Núm. 1
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High and low molecular weight crossovers in the longest relaxation time dependence of linear cis-1,4 polyisoprene by dielectric relaxations
Rheologica Acta, Vol. 49, Núm. 5, pp. 507-512
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Imaging dielectric relaxation in nanostructured polymers by frequency modulation electrostatic force microscopy
Applied Physics Letters, Vol. 96, Núm. 21
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Nanodielectric mapping of a model polystyrene-poly(vinyl acetate) blend by electrostatic force microscopy
Physical Review E - Statistical, Nonlinear, and Soft Matter Physics, Vol. 81, Núm. 1
2009
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Determination of the nanoscale dielectric constant by means of a double pass method using electrostatic force microscopy
Journal of Applied Physics, Vol. 106, Núm. 2
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Rouse-model-based description of the dielectric relaxation of nonentangled linear 1,4-cis-polyisoprene
Macromolecules, Vol. 42, Núm. 21, pp. 8492-8499