Simultaneous IR material recognition and conductivity mapping by nanoscale near-field microscopy

  1. Huber, A.J.
  2. Kazantsev, D.
  3. Keilmann, F.
  4. Wittborn, J.
  5. Hillenbrand, R.
Revue:
Advanced Materials

ISSN: 0935-9648

Année de publication: 2007

Volumen: 19

Número: 17

Pages: 2209-2212

Type: Article

DOI: 10.1002/ADMA.200602303 GOOGLE SCHOLAR
La source de données: Scopus