Temperature-depending Raman line-shift of silicon carbide

  1. Bauer, M.
  2. Gigler, A.M.
  3. Huber, A.J.
  4. Hillenbrand, R.
  5. Stark, R.W.
Revue:
Journal of Raman Spectroscopy

ISSN: 1097-4555,  0377-0486

Année de publication: 2009

Volumen: 40

Número: 12

Pages: 1867-1874

Type: Article

DOI: 10.1002/JRS.2334 GOOGLE SCHOLAR
La source de données: Scopus