Quantitative, nanoscale free-carrier concentration mapping using terahertz near-field nanoscopy
- Wittborn, J.
- Weiland, R.
- Huber, A.J.
- Keilmann, F.
- Hillenbrand, R.
Actas:
Conference Proceedings from the International Symposium for Testing and Failure Analysis
ISBN: 9781615030415
Ano de publicación: 2010
Páxinas: 20-26
Tipo: Achega congreso