Frustration-driven micromagnetic structure in Fe/CoO/Fe thin film layered systems

  1. Brambilla, A.
  2. Sessi, P.
  3. Cantoni, M.
  4. Finazzi, M.
  5. Rougemaille, N.
  6. Belkhou, R.
  7. Vavassori, P.
  8. Duò, L.
  9. Ciccacci, F.
Revue:
Physical Review B - Condensed Matter and Materials Physics

ISSN: 1098-0121,  1550-235X

Année de publication: 2009

Volumen: 79

Número: 17

Type: Article

DOI: 10.1103/PHYSREVB.79.172401 GOOGLE SCHOLAR
La source de données: Scopus