Investigation of Physical and electrochemical properties of Ni doped CeO2 Thin films: DFT calculation
- Zimou, J.
- Nouneh, K.
- Talbi, A.
- El Gana, L.
- Hsissou, R.
- El Habib, A.
- Ahmoum, H.
- Briche, S.
- El Jouad, Z.
- Beraich, M.
- Addou, M.
Revue:
Current Applied Physics
ISSN: 1567-1739
Année de publication: 2021
Volumen: 31
Pages: 171-181
Type: Article