The structure of Si nanocrystals on SiC

  1. Kaiser, U.
  2. Chuvilin, A.
  3. Saitoh, K.
  4. Richter, W.
Revue:
Journal of Electron Microscopy

ISSN: 0022-0744

Année de publication: 2001

Volumen: 50

Número: 4

Pages: 311-319

Type: Article

DOI: 10.1093/JMICRO/50.4.311 GOOGLE SCHOLAR
La source de données: Scopus