Testing the temperature limits of GaN-based HEMT devices

1. Maier, D.
2. Alomari, M.
3. Grandjean, N.
4. Carlin, J.-F.
5. Diforte-Poisson, M.-A.
6. Dua, C.
7. Chuvilin, A.
8. Troadec, D.
9. Gaquière, C.
10. Kaiser, U.
11. Delage, S.L.
12. Kohn, E.