A Test Stand for Ion Sources of Ultimate Reliability
- Enparantza, R.
- Uriarte, L.
- Bermejo, F. J.
- Etxebarria, V.
- Lucas, J.
- Del Rio, J. M.
- Letchford, A.
- Faircloth, D.
- Stockli, M.
- Romano, P.
- Alonso, J.
- Ariz, I.
- Egiraun, M.
- Surrey, E (coord.)
- Simonin, A (coord.)
ISSN: 0094-243X
ISBN: 978-0-7354-0630-8
Année de publication: 2009
Volumen: 1097
Pages: 461-462
Congreso: 1st International Symposium on Negative Ions, Beams and Sources
Type: Communication dans un congrès