A systematic review on the use of AR/VR techniques in Remote Laboratories
- Da Silva, I.N.
- Zubía, J.G.
- Jayo, U.H.
Actas:
15th International Conference of Technology, Learning and Teaching of Electronics, TAEE 2022 - Proceedings
ISBN: 9781665421614
Ano de publicación: 2022
Tipo: Achega congreso