THz scattering-type near-field microscopy of semiconductor conductivity and mobility
- Keilmann, F.
- Huber, A.J.
- Aizpurua, J.
- Wittborn, J.
- Hillenbrand, R.
Konferenzberichte:
Optics InfoBase Conference Papers
ISSN: 2162-2701
ISBN: 9781424440801
Datum der Publikation: 2009
Art: Konferenz-Beitrag