Harmonic Voltage Reflection Analysis of UHF RFID Chips
- Muralter, F.
- Hani, M.
- Landaluce, H.
- Perallos, A.
- Biebl, E.M.
Revista:
IEEE Transactions on Instrumentation and Measurement
ISSN: 1557-9662, 0018-9456
Any de publicació: 2021
Volum: 70
Tipus: Article