Improving the Performance of Heterogeneous Data Centers through Redundancy
- Anton, E.
- Ayesta, U.
- Jonckheere, M.
- Verloop, I.M.
Konferenzberichte:
SIGMETRICS 2021 - Abstract Proceedings of the 2021 ACM SIGMETRICS / International Conference on Measurement and Modeling of Computer Systems
ISBN: 9781450380720
Datum der Publikation: 2021
Seiten: 55-56
Art: Konferenz-Beitrag