A method to extract lumped thermal networks of capacitors for reliability oriented design

  1. Delmonte, N.
  2. Cabezuelo, D.
  3. Kortabarria, I.
  4. Santoro, D.
  5. Toscani, A.
  6. Cova, P.
Revista:
Microelectronics Reliability

ISSN: 0026-2714

Any de publicació: 2020

Volum: 114

Tipus: Article

DOI: 10.1016/J.MICROREL.2020.113737 GOOGLE SCHOLAR lock_openeBiltegia editor
Font de les dades: Scopus