Scanning force microscopy characterization of individual carbon nanotubes on electrode arrays

  1. Muster, J.
  2. Burghard, M.
  3. Roth, S.
  4. Duesberg, G.S.
  5. Hernández, E.
  6. Rubio, A.
Revue:
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

ISSN: 1071-1023

Année de publication: 1998

Volumen: 16

Número: 5

Pages: 2796-2801

Type: Article

DOI: 10.1116/1.590274 GOOGLE SCHOLAR
La source de données: Scopus