A methodology to obtain traceability for internal and external measurements of Inconel 718 components by means of XRCT
- Ortega, N.
- Plaza, S.
- Pascual, A.
- Holgado, I.
- Lamikiz, A.
Revista:
NDT and E International
ISSN: 0963-8695
Any de publicació: 2021
Volum: 120
Tipus: Article