What are the limitations in the characterization of self-assembled metamaterials using advanced microscopy techniques?

  1. Kiely, C.J.
  2. Watanabe, M.
  3. Burrows, A.
  4. Clasen, P.
  5. Harmer, M.P.
  6. Rodríguez-González, B.
  7. Liz-Marzán, L.
  8. Hussain, I.
  9. Fink, J.
  10. Brust, M.
Revue:
Microscopy and Microanalysis

ISSN: 1431-9276

Année de publication: 2005

Volumen: 11

Número: SUPPL. 2

Pages: 204-205

Type: Communication dans un congrès

DOI: 10.1017/S1431927605507153 GOOGLE SCHOLAR lock_openAccès ouvert editor
La source de données: Scopus