Measurement based nonlinear electrothermal modeling of GaAs FET with dynamical trapping effects
- Ouarch, Z.
- Collantes, J.M.
- Teyssier, J.P.
- Quere, R.
Actas:
IEEE MTT-S International Microwave Symposium Digest
ISSN: 0149-645X
Ano de publicación: 1998
Volume: 2
Páxinas: 599-602
Tipo: Achega congreso