Statistical analysis of accuracy in noise figure measurements
- Otegi, N.
- Collantes, J.M.
- Sayed, M.
Konferenzberichte:
2005 66th ARFTG Microwave Measurement Conference: Digital Communication System Metrics, ARFTG 2005
ISBN: 9781538672921
Datum der Publikation: 2005
Seiten: 1-6
Art: Konferenz-Beitrag