Auger electron spectroscopical investigation of interfacial segregation in the Cu-Bi system

  1. López, G.A.
  2. Mittemeijer, E.J.
Revue:
Defect and Diffusion Forum

ISSN: 1662-9507 1012-0386

Année de publication: 2005

Volumen: 237-240

Número: PART 2

Pages: 1141-1146

Type: Communication dans un congrès