Determination of the integrated x-ray scattering intensities through the electron-pair relative-motion density at the origin

  1. Valderrama, E.
  2. Fradera, X.
  3. Ugalde, J.M.
Revue:
Physical Review A - Atomic, Molecular, and Optical Physics

ISSN: 1094-1622,  1050-2947

Année de publication: 2001

Volumen: 64

Número: 4

Pages: 4

Type: Article

DOI: 10.1103/PHYSREVA.64.044501 GOOGLE SCHOLAR
La source de données: Scopus