Imaging dielectric relaxation in nanostructured polymers by frequency modulation electrostatic force microscopy
- Riedel, C.
- Sweeney, R.
- Israeloff, N.E.
- Arinero, R.
- Schwartz, G.A.
- Alegria, A.
- Tordjeman, Ph.
- Colmenero, J.
Revista:
Applied Physics Letters
ISSN: 0003-6951
Any de publicació: 2010
Volum: 96
Número: 21
Tipus: Article