Study of the influence of bias and matching networks on the distortion and memory of FET-based power amplifiers

  1. Santiago, J.
  2. Portilla, J.
  3. Fernández, T.
Revue:
International Journal of RF and Microwave Computer-Aided Engineering

ISSN: 1096-4290,  1099-047X

Année de publication: 2008

Volumen: 18

Número: 6

Pages: 517-526

Type: Article

DOI: 10.1002/MMCE.20327 GOOGLE SCHOLAR
La source de données: Scopus